Electronic Design Today  |   To view this email as a web page, click here.
 
 
Electronic Design Today
February 23, 2021
 
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This Crucial WBG Power Transistor Reliability Test is Often Missing

What is this important "failure" test and why it is important? This article also speculates as to why it seems to be missing from most GaN and SiC suppliers’ reliability reports.

 
 
 
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From resources like the Analog Engineer's Circuit Cookbook and Pocket Reference to tech article topics such as op-amp selection, this reference center delivers an array of design tips and tools to meet specific end-equipment needs.


 
The new functionalities, efficiencies, and reliability provided by the latest software-driven solutions available is changing the very face of society.

We looked up Omid Sojoodi, NI’s VP of R&D and Application Software, and asked him some questions about what he thinks of the state of the industry.

 
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